{"id":10441,"date":"2022-09-19T05:30:18","date_gmt":"2022-09-19T05:30:18","guid":{"rendered":"https:\/\/www.szlaser.com\/?page_id=10441"},"modified":"2022-09-19T06:00:51","modified_gmt":"2022-09-19T06:00:51","slug":"optical-defects","status":"publish","type":"page","link":"https:\/\/www.szlaser.com\/index.php\/wiki\/optical-defects\/","title":{"rendered":"Optical Defects According to ISO standard"},"content":{"rendered":"

Optical Defects According to ISO standard<\/h1><\/h1><\/div>

The ISO 10110 standards are widely used in Europe, so it is relevant to cover here. With regards to this chapter, part 7 of ISO 10110 deserves attention. The ISO 14997:2011 standard establishes the physical principles and practical means for implementating the methods, as specified in ISO 10110-7 for measuring surface imperfections. The treatment here includes references, where needed, to the appropriate standard. The introduction of ISO 10110-7 reads thusly:
\nMeasurement is only required as a second stage operation following\u00a0inspection necessary to determine location and to select a surface\u00a0imperfection worthy of study, see ISO 14997. In such cases, a drawing\u00a0notation indicating this level of inspection is required and can be\u00a0added to the specification. This process, not depending on the eye, is more time consuming and is usually only carried out when a surface\u00a0imperfection could influence performance as, for example, in laser or\u00a0low-light level systems or when a more precise measure is demanded.
\nThis is an important paragraph that establishes the visual inspection as the first stage and the measurement inspection as the second stage. Do not forget it!
\nISO 10110-7 refers to a localized surface imperfection by its square root area in millimeters and to long scratches (longer than 2 mm) by their width in millimeters. However, unlike the scratch and dig designations in the milspecs, the ISO refers to these imperfections in terms of localized surface imperfections, long scratches, and edge chips, as well. This standard applies to transmitting and reflecting coated and uncoated surfaces of finished optical elements and to optical assemblies.
\nThe drawing indication for the number and size of surface imperfections permissible within the effective aperture of a surface is<\/p>\n

\"\"<\/p>\n

and for localized surface imperfections in optical assemblies,<\/p>\n

\"\"<\/p>\n

where 5 is the code for surface imperfections, 15 is the code for localized surface imperfections in optical assemblies, N is the number of allowed imperfections of the maximum permitted size, and A is a grade number that equals the square root of the area of the maximum allowed imperfection (in millimeters).<\/p>\n

If needed, coating blemishes may be specified separately from the\u00a0localized surface imperfections. Following the indication for surface\u00a0imperfections and separated from it by a semicolon, the indication for coating blemishes permissible within the effective aperture of a surface or assembly is<\/p>\n

\"\"<\/p>\n

coating blemishes permissible where C is the designation for coating blemishes, N0 is the number of allowed blemishes of the maximum permitted size, and A0 is the grade number defined for general indication. Therefore, the designation for the imperfection indication including coating blemishes for surfaces is<\/p>\n

\"\"<\/p>\n

and for assemblies the designation is<\/p>\n

Image<\/p>\n

If the only existing designation is<\/p>\n

\"\"<\/p>\n

then the coating blemishes should be included in the permissible surface imperfection indication.
\nLong scratches are those that are longer than 2 mm; their designation is<\/p>\n

\"\"<\/p>\n

where L is the indication for long scratches, N00 is the number of allowed long scratches, and A00 specifies the maximum allowed width of the scratches (in millimeters). The imperfection indication including coating blemishes and long scratches is<\/p>\n

\"\"<\/p>\n

If the only existing designation is<\/p>\n

\"\"<\/p>\n

then the long scratches or coating blemishes should be included in the permissible surface imperfection indication.
\nThe designation of edge chips is<\/p>\n

\"\"<\/p>\n

where E is the edge-chip designation, and A000 is the maximum permitted chip in millmeters. If the indication for edge chips is not given, then edge chips are allowed so long as they do not enter the optical effective aperture.<\/p>\n

The complete imperfection indication for all of the imperfections mentioned here is<\/p>\n

\"\"<\/p>\n

where 5 represents the surface imperfections, 15 represents the surface imperfections in optical assemblies, N x A is the indication for surface imperfections, CN\u2019 A\u2018 is the indication for coating blemishes, L\/N\u2019\u2019 A\u2019\u2019 is the indication for long scratches, and EA\u2018\u2019\u2018 is the indication for edge chips.
\nIt appears that short scratches, less so than ones longer than 2 mm, which are indicated by L, are indicated by 5\/N x A for the surface, 15\/N x A for assemblies, and C\/N\u2019 x A\u2019 for coatings. These short scratches\u2014along with other localized imperfections (pits, sleeks, scuffs, fixture marks, or coating blemishes)\u2014are calculated as the square root of the area of the maximum allowed imperfection, expressed in millimeters. The parameter comparable with the localized surface imperfection in ISO 10110-7 is the dig of the milspecs.<\/p>\n<\/div>

A few thoughts about optical defects ><\/span><\/a><\/div><\/div><\/div><\/div><\/div>\n","protected":false},"excerpt":{"rendered":"","protected":false},"author":7,"featured_media":0,"parent":8230,"menu_order":105,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false,"footnotes":""},"class_list":["post-10441","page","type-page","status-publish","hentry"],"acf":[],"yoast_head":"\nOptical Defects According to ISO standard - SZLASER<\/title>\n<meta name=\"description\" content=\"The ISO refers to these imperfections in terms of localized surface imperfections, long scratches, and edge chips, as well.\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.szlaser.com\/index.php\/wiki\/optical-defects\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Optical Defects According to ISO standard\" \/>\n<meta property=\"og:description\" content=\"The ISO refers to these imperfections in terms of localized surface imperfections, long scratches, and edge chips, as well.\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.szlaser.com\/index.php\/wiki\/optical-defects\/\" \/>\n<meta property=\"og:site_name\" content=\"SZLASER\" \/>\n<meta property=\"article:modified_time\" content=\"2022-09-19T06:00:51+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/www.szlaser.com\/wp-content\/uploads\/2022\/09\/the-number-and-size-of-surface-imperfections.png\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data1\" content=\"7 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\/\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\/\/www.szlaser.com\/index.php\/wiki\/optical-defects\/\",\"url\":\"https:\/\/www.szlaser.com\/index.php\/wiki\/optical-defects\/\",\"name\":\"Optical Defects According to ISO standard - 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